Semiconductor memories : technology, testing, and reliability 🔍
Ashok K. Sharma Wiley-IEEE Press, 1, US, 2002
English [en] · PDF · 11.9MB · 2002 · 📘 Book (non-fiction) · 🚀/duxiu/lgli/lgrs/nexusstc/zlib · Save
description
semiconductor Memories Provides In-depth Coverage In The Areas Of Design For Testing, Fault Tolerance, Failure Modes And Mechanisms, And Screening And Qualification Methods Including.
* Memory Cell Structures And Fabrication Technologies.
* Application-specific Memories And Architectures.
* Memory Design, Fault Modeling And Test Algorithms, Limitations, And Trade-offs.
* Space Environment, Radiation Hardening Process And Design Techniques, And Radiation Testing.
* Memory Stacks And Multichip Modules For Gigabyte Storage.
Alternative filename
lgli/_332921.4cb0ba8b6bd0a59241473d0c36b6c9c5.pdf
Alternative filename
lgrsnf/_332921.4cb0ba8b6bd0a59241473d0c36b6c9c5.pdf
Alternative filename
zlib/Engineering/Ashok K. Sharma/Semiconductor Memories: Technology, Testing, and Reliability_1054574.pdf
Alternative author
Sharma, Ashok K.
Alternative publisher
IEEE, the Institute of Electrical and Electronics Engineers ; Wiley-Interscience
Alternative publisher
IEEE Press ; Institute of Electrical and Electronics Engineers
Alternative edition
New York, Hoboken, N.J, New York State, 1997
Alternative edition
United States, United States of America
Alternative edition
Piscataway, N.J., New York, ©1997
Alternative edition
September 9, 2002
metadata comments
до 2011-08
metadata comments
lg615335
metadata comments
{"edition":"1","isbns":["0780310004","9780780310001"],"last_page":473,"publisher":"Wiley-IEEE Press"}
metadata comments
Includes bibliographical references and index.
"IEEE Solid-State Circuits Council, sponsor."
Alternative description
This all-original book brings you in-depth coverage of the most vital microelectronic component of digital logic system design: semiconductor memory. Keeping pace with the explosive growth in submicron development, the author presents state-of-the-art information on semiconductor memory technology for both volatile and nonvolatile memory devices, including testing, reliability issues, and radiation effects. Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods. This book will be valuable to all industry professionals and students working with semiconductor memories, including those in computing, automotive, military, and aerospace fields.
Alternative description
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date open sourced
2011-08-31
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