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lgli/A:\usenetabtechnical\Semiconductor Electronics - A. Sharma (New Age Int'l., 1996) WW.pdf
Semiconductor memories : technology, testing, and reliability 🔍
Ashok K Sharma; IEEE Solid-State Circuits Council New Age Int'l., New York, New Jersey, 1996
English [en] · PDF · 11.7MB · 1996 · 📘 Book (non-fiction) · 🚀/duxiu/lgli/lgrs/nexusstc/zlib · Save
description
semiconductor Memories Provides In-depth Coverage In The Areas Of Design For Testing, Fault Tolerance, Failure Modes And Mechanisms, And Screening And Qualification Methods Including.
* Memory Cell Structures And Fabrication Technologies.
* Application-specific Memories And Architectures.
* Memory Design, Fault Modeling And Test Algorithms, Limitations, And Trade-offs.
* Space Environment, Radiation Hardening Process And Design Techniques, And Radiation Testing.
* Memory Stacks And Multichip Modules For Gigabyte Storage.
Alternative filename
lgrsnf/A:\usenetabtechnical\Semiconductor Electronics - A. Sharma (New Age Int'l., 1996) WW.pdf
Alternative filename
nexusstc/Semiconductor memories : technology, testing, and reliability/1ae0d70c146f217d3a48b2367c2936e0.pdf
Alternative filename
zlib/Engineering/Ashok K Sharma; IEEE Solid-State Circuits Council/Semiconductor memories : technology, testing, and reliability_2059186.pdf
Alternative title
Telecommunications Wiring for Commercial Buildings: A Practical Guide (Ieee Telecommunications Handbook Series)
Alternative author
Elliott M. Gilbert, John G. Nellist, Elliot M. Gilbert
Alternative author
Elliot M. Gilbert, Elliott M. Gilbert, John G. Nellist
Alternative author
Gilbert, Elliott M., Nellist, John G.
Alternative author
Sharma, Ashok K.
Alternative publisher
IEEE, the Institute of Electrical and Electronics Engineers ; Wiley-Interscience
Alternative publisher
IEEE Press ; Institute of Electrical and Electronics Engineers
Alternative publisher
Institute of Electrical & Electronics Enginee; IEEE Press
Alternative publisher
Wiley-IEEE Press
Alternative edition
New York, Hoboken, N.J, New York State, 1997
Alternative edition
Piscataway, N.J, New York, New Jersey, 1997
Alternative edition
United States, United States of America
Alternative edition
Washington, DC, 1996
Alternative edition
September 9, 2002
Alternative edition
October 1995
Alternative edition
1, US, 2002
metadata comments
usenet tech -- 2012-06
metadata comments
lg904928
metadata comments
{"isbns":["0780310004","0780311140","9780780310001","9780780311145"],"last_page":274,"publisher":"New Age"}
metadata comments
Includes bibliographical references and index.
"IEEE Solid-State Circuits Council, sponsor."
metadata comments
Includes bibliographical references (p. 191-194) and index.
metadata comments
Includes bibliographical references and index.
"IEEE order number: PC3491"--P. [4] cover.
"IEEE Solid-State Circuits Council, sponsor."
Alternative description
This all-original book brings you in-depth coverage of the most vital microelectronic component of digital logic system design: semiconductor memory. Keeping pace with the explosive growth in submicron development, the author presents state-of-the-art information on semiconductor memory technology for both volatile and nonvolatile memory devices, including testing, reliability issues, and radiation effects. Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods. This book will be valuable to all industry professionals and students working with semiconductor memories, including those in computing, automotive, military, and aerospace fields.
date open sourced
2013-03-30
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